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HFBTE C Type Impact Device with C Probe and Cable for Leeb Hardness Tester Small/Light/Thin Parts,Hardened Layer Surface NDT Test

HFBTE C Type Impact Device with C Probe and Cable for Leeb Hardness Tester Small/Light/Thin Parts,Hardened Layer Surface NDT Test

Customer rating ★★★★★☆ 4.6 stars

Imported from USA | Ships in 10 working days

5% additional discount on UPI | Cash On Delivery available

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₹92170 -40% ₹55300/-

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Product Information


Specification
Amount : 300.00
Brand : HFBTE
CurrencyCode : USD
Label : HFBTE
Manufacturer : HFBTE
Model : 2023110803
NumberOfItems : 1
PackageDimensions_Weight : 1.1023113100
PackageDimensions : L:11.81102361000 X W:7.87401574000 X H:4.72440944400
PartNumber : 2023110803
ProductGroup : BISS Basic
ProductTypeName : PRECISION_MEASURING
Publisher : HFBTE
SmallImage_Height : 75
SmallImage_URL : https://m.media-amazon.com/images/I/41lUmhGg2EL._SL75_.jpg
SmallImage_Width : 56
Studio : HFBTE
Title : HFBTE C Type Impact Device with C Probe and Cable for Leeb Hardness Tester Small/Light/Thin Parts,Hardened Layer Surface NDT Test
Weight : 1.1
WeightUnit : pounds

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Ratings & Review

Rating Breakdown (average)

5*
8
4*
3
3*
1
2*
0
1*
0

Read all 12 customer reviews

Will be purchasing again soon.

★★★★★

Reliable and efficient.

★★★★★

Meets basic needs, not exceptional.

★★★★★

CanÕt believe how great this is.

★★★★★

Worth the price, satisfied.

★★★★★

Five stars all the way.

★★★★★

Top-notch quality, canÕt complain.

★★★★★

High quality and great value.

★★★★★

Everything about this is perfect.

★★★★★

Feels premium and well-crafted.

★★★★★

Very useful and nicely packaged.

★★★★★

Perfect for my needs.

★★★★★

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