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VTSYIQI DC Impact Device Probe for YHT100E Leeb Hardness Tester Meter Recalibrate Identify Impact Device Automatically

VTSYIQI DC Impact Device Probe for YHT100E Leeb Hardness Tester Meter Recalibrate Identify Impact Device Automatically

Customer rating ★★★★★ 4.1 stars

Imported from USA | Ships in 10 working days

5% additional discount on UPI | Cash On Delivery available

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₹56310 -35% ₹36600/-

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Product Information


Specification
Brand : VTSYIQI
Color : Black
Label : VTSYIQI
Manufacturer : VTSYIQI
MaterialType : Plastic
PackageDimensions_Weight : 4.4092452400
PackageDimensions : L:11.81102361000 X W:7.87401574000 X H:3.93700787000
PartNumber : DC Impact device Probe
ProductGroup : BISS Basic
ProductTypeName : PRECISION_MEASURING
Publisher : VTSYIQI
Size : large
SmallImage_Height : 75
SmallImage_URL : https://m.media-amazon.com/images/I/313dPUFz1aL._SL75_.jpg
SmallImage_Width : 38
Studio : VTSYIQI
Title : VTSYIQI DC Impact Device Probe for YHT100E Leeb Hardness Tester Meter Recalibrate Identify Impact Device Automatically
Weight : 4.4
WeightUnit : pounds

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Ratings & Review

Rating Breakdown (average)

5*
3
4*
3
3*
2
2*
0
1*
0

Read all 8 customer reviews

Meets basic needs, not exceptional.

★★★★★

Really liked this product, works well.

★★★★★

Does the job but nothing extraordinary.

★★★★★

Very functional and easy to use.

★★★★★

Will definitely recommend to others.

★★★★★

CouldnÕt be happier with this purchase.

★★★★★

This deserves more than 5 stars.

★★★★★

Will be purchasing again soon.

★★★★★

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