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VTSYIQI Leeb Hardness Tester C Type Impact Device for Smaller Thin Compone NDT Test

VTSYIQI Leeb Hardness Tester C Type Impact Device for Smaller Thin Compone NDT Test

Customer rating ★★★★★☆ 4.7 stars

Imported from USA | Ships in 10 working days

5% additional discount on UPI | Cash On Delivery available

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₹90670 -40% ₹54400/-

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Product Information


Specification
Amount : 600.00
Brand : VTSYIQI
CurrencyCode : USD
Label : VTSYIQI
Manufacturer : VTSYIQI
MaterialType : plastic
Model : C type impact device
NumberOfItems : 1
PackageDimensions_Weight : 5.0706320260
PackageDimensions : L:11.81102361000 X W:7.87401574000 X H:3.93700787000
PartNumber : C type impact device probe
ProductGroup : BISS Basic
ProductTypeName : ELECTRIC_CIRCUIT_TESTING_DEVICE
Publisher : VTSYIQI
SmallImage_Height : 66
SmallImage_URL : https://m.media-amazon.com/images/I/41cpOaLTOfL._SL75_.jpg
SmallImage_Width : 75
Studio : VTSYIQI
Title : VTSYIQI Leeb Hardness Tester C Type Impact Device for Smaller Thin Compone NDT Test
Weight : 5.1
WeightUnit : pounds

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Ratings & Review

Rating Breakdown (average)

5*
8
4*
1
3*
1
2*
0
1*
0

Read all 10 customer reviews

Best product IÕve bought recently.

★★★★★

Very useful and nicely packaged.

★★★★★

One of the best things IÕve ever bought.

★★★★★

Everything about this is perfect.

★★★★★

Remarkably good and exceeded all expectations.

★★★★★

This works like a charm.

★★★★★

Top-notch quality, canÕt complain.

★★★★★

Does the job but nothing extraordinary.

★★★★★

Top-notch quality, canÕt complain.

★★★★★

High quality and great value.

★★★★★

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