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VTSYIQI Leeb Hardness Tester C Type Impact Device Smaller Thin Impact Device for Smaller Thin Compone NDT Test

VTSYIQI Leeb Hardness Tester C Type Impact Device Smaller Thin Impact Device for Smaller Thin Compone NDT Test

Customer rating ★★★★★☆ 4.7 stars

Imported from USA | Ships in 10 working days

5% additional discount on UPI | Cash On Delivery available

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₹87350 -36% ₹55900/-

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Product Information


Specification
Amount : 600.00
Brand : VTSYIQI
Color : Yellow
CurrencyCode : USD
Label : VTSYIQI202310111444
Manufacturer : VTSYIQI202310111444
MaterialType : plastic
Model : C type impact device
NumberOfItems : 1
PackageDimensions_Weight : 0.8818490480
PackageDimensions : L:11.81102361000 X W:7.87401574000 X H:3.93700787000
PartNumber : C type impact device probe
ProductGroup : BISS Basic
ProductTypeName : ELECTRIC_CIRCUIT_TESTING_DEVICE
Publisher : VTSYIQI202310111444
Size : Large
SmallImage_Height : 75
SmallImage_URL : https://m.media-amazon.com/images/I/41NXoA6tsoL._SL75_.jpg
SmallImage_Width : 56
Studio : VTSYIQI202310111444
Title : VTSYIQI Leeb Hardness Tester C Type Impact Device Smaller Thin Impact Device for Smaller Thin Compone NDT Test
Weight : 0.9
WeightUnit : pounds

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Ratings & Review

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Read all 9 customer reviews

Will definitely recommend to others.

★★★★★

Will definitely recommend to others.

★★★★★

Very functional and easy to use.

★★★★★

Five stars all the way.

★★★★★

Top-notch quality, canÕt complain.

★★★★★

Feels premium and well-crafted.

★★★★★

Feels premium and well-crafted.

★★★★★

Will be purchasing again soon.

★★★★★

Everything about this is perfect.

★★★★★

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