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VTSYIQI Leeb Hardness Tester Impact Device Small Aperture DC Impact Device Probe for Leeb Hardness Tester Meter

VTSYIQI Leeb Hardness Tester Impact Device Small Aperture DC Impact Device Probe for Leeb Hardness Tester Meter

Customer rating ★★★★★ 4.1 stars

Imported from USA | Ships in 10 working days

5% additional discount on UPI | Cash On Delivery available

1

₹68990 -31% ₹47600/-

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Product Information


Specification
Brand : VTSYIQI
Label : VTSYIQI202310111408
Manufacturer : VTSYIQI202310111408
MaterialType : Plastic
NumberOfItems : 1
PackageDimensions_Weight : 4.4092452400
PackageDimensions : L:11.81102361000 X W:7.87401574000 X H:3.93700787000
PartNumber : VTSYIQI202310111408
ProductGroup : BISS Basic
ProductTypeName : PRECISION_MEASURING
Publisher : VTSYIQI202310111408
SmallImage_Height : 75
SmallImage_URL : https://m.media-amazon.com/images/I/21IabrssXGL._SL75_.jpg
SmallImage_Width : 48
Studio : VTSYIQI202310111408
Title : VTSYIQI Leeb Hardness Tester Impact Device Small Aperture DC Impact Device Probe for Leeb Hardness Tester Meter
Weight : 4.4
WeightUnit : pounds

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Ratings & Review

Rating Breakdown (average)

5*
3
4*
6
3*
2
2*
0
1*
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Read all 11 customer reviews

Very useful and nicely packaged.

★★★★★

Remarkably good and exceeded all expectations.

★★★★★

An average experience overall.

★★★★★

Exactly what I was looking for.

★★★★★

Really liked this product, works well.

★★★★★

Truly exceeded my expectations.

★★★★★

Great choice for daily use.

★★★★★

Quality is fine, but packaging was average.

★★★★★

Just what I needed and more.

★★★★★

Reliable and efficient.

★★★★★

Worth the price, satisfied.

★★★★★

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