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VTSYIQI Leeb Hardness Tester Impact Device Small Aperture DC Impact Device Probe for Leeb Hardness Tester Meter

VTSYIQI Leeb Hardness Tester Impact Device Small Aperture DC Impact Device Probe for Leeb Hardness Tester Meter

Customer rating ★★★★★ 4.3 stars

Imported from USA | Ships in 10 working days

5% additional discount on UPI | Cash On Delivery available

1

₹73240 -35% ₹47600/-

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Product Information


Specification
Brand : VTSYIQI
Label : VTSYIQI202310111408
Manufacturer : VTSYIQI202310111408
MaterialType : Plastic
NumberOfItems : 1
PackageDimensions_Weight : 4.4092452400
PackageDimensions : L:11.81102361000 X W:7.87401574000 X H:3.93700787000
PartNumber : VTSYIQI202310111408
ProductGroup : BISS Basic
ProductTypeName : PRECISION_MEASURING
Publisher : VTSYIQI202310111408
SmallImage_Height : 75
SmallImage_URL : https://m.media-amazon.com/images/I/21IabrssXGL._SL75_.jpg
SmallImage_Width : 48
Studio : VTSYIQI202310111408
Title : VTSYIQI Leeb Hardness Tester Impact Device Small Aperture DC Impact Device Probe for Leeb Hardness Tester Meter
Weight : 4.4
WeightUnit : pounds

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Ratings & Review

Rating Breakdown (average)

5*
7
4*
2
3*
3
2*
0
1*
0

Read all 12 customer reviews

Performs well under regular usage.

★★★★★

IÕm extremely impressed with this item.

★★★★★

Delivers what it promises and more.

★★★★★

CanÕt believe how great this is.

★★★★★

Practical and effective.

★★★★★

This deserves more than 5 stars.

★★★★★

Highly recommended for everyone.

★★★★★

Just fine for the price, not more.

★★★★★

Perfect for my needs.

★★★★★

Satisfactory but not impressive.

★★★★★

High quality and great value.

★★★★★

Quality is fine, but packaging was average.

★★★★★

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